By Matthew Chin
– a joint venture between the Department of Materials Science and The Cotsen Institute of Archaeology at UCLA, held its annual Best SEM (scanning electron microscope) Image Award ceremony on January 25, 2013.
The students’ images were taken with the lab’s SEM Nova Nano 230 (FEI).
FEI Tony Awards
Presented by Tony L. Carpenter, U.S. Sales Manager for FEI Company, which manufactured the lab’s SEM. The first place winner received a large luggage bag, embroidered with the FEI logo.
Photos by the Materials Science and Engineering Department and Professor Christian Fischer, Materials Science and Engineering and UCLA/Getty Conservation Program